K-MAC ST4000 DLX Thin Film Thickness Measurement System

K-MAC ST4000 DLX Thin Film Thickness Measurement System

kmac st4000

Standard Model

Industrial Specifications

For R&D Center

Fast Measurement & Easy Operation

Non-contacy & Non-destructive

Superb Repeatability & Reproducibility

Windows Based User-friendly Interface

Print Function of Each View & Data Saving 

Stage Size: 200mm x 200mm (8"), 300mm x 300mm (12")

Measurement Range: 100Å - 35µm (Depends on Film Type)

Spot Size: 40µm / 20µm, 4µm (Option)

Measurement Speed: 1-2 sec./site

Application Areas: All capability of ST2000 & more precision measurement / Intended for Wafer Measurement & OLED

Option: Programmable Auto Z Stage / Referance Sample (K-MAC or KRISS or NIST) / CCD Camera / Transmittance Module

Focus: Coaxial Coarse & Fine Focus Controls

Incident Illumination: 12V 100W Halogen Lamp

Dimensions: 500 x 610 x 640mm

Weight: 45kg

Type: Manual

Measuring Sample Size: ≤8", 12"

Measurement Method: Non-contact

Measurement Principle: Reflectometer

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