K-MAC ST2000 DLX-n Thin Film Thickness Measurement System

K-MAC ST2000 DLX-n Thin Film Thickness Measurement System

kmac st2000

Best Price

For Universities and R&D Centers

Fast Measurement & Easy Operation

Non-contact & Non-destructive

Superb repeatability & Reproducibility

Windows based user-friendly interface

Print function of each view and data saving

Supporting up to 3 layers

Supporting back site reflection

Stage Size: 150 x 120mm (70 x 50mm travel distance)

Measurement Range: 200Å - 35µm (Depends on film type)

Spot Size: 20µm typically

Measurement Speed: 1-2sec / site

Application Areas: Polymers, Dielectrics, Semi-Conductors

Option: Referance sample (K-MAC, KRISS OR NIST)

Head: Trinocular head

Nosepiecs: Quadruple Revolving mechanism with inward tilt

Type of Illumination: 12V 35W Halogen Lamp Built-in Control Device & Transformer

Dimensions: 190 x 265 x 316mm

Weight: 12kg

Type: Manual

Measuring Sample Size: ≤4"

Measuring Method: Non-contact

Measuring Principle: Reflectometer

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